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Film Thickness Measurement System SKOP

Film Thickness Measurement System SKOP

An inexpensive and simple film thickness measurement system using Ocean Optics spectrometers!

The SKOP (Starter Kit for Optical thickness measurement) optical film thickness measurement system measures the spectral reflectance of optical thin films and determines their thickness by analyzing the spectrum. The thin film on the substrate acts as an etalon, causing an interference pattern in the reflection spectrum. The spacing between the peaks of the sinusoidal pattern correlates with the refractive index of the material and the thickness of the film. In SKOP, the interference pattern is analyzed using dedicated software to convert it into the film thickness.

  • Coating thickness gauge

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Film thickness measurement system "FilmSmart"

Film thickness measurement system "FilmSmart"

A system that is rich in options such as spectrometers, light sources, and stages, and is compact, lightweight, and inexpensive.

"FilmSmart" is a film thickness measurement system from HMTEK (Taiwan) that can measure film thickness, refractive index n/attenuation coefficient k, transmission/reflection rates, and color. It is an integrated system with a CCD spectrometer, light source, stage, fiber optic coupling system, computer, and software, requiring no complicated tasks or settings, allowing for easy surface and thin film measurements. 【Features】 ■ Measurement range: 200A to 400,000A ■ Wavelength range: 380-850nm ■ Capable of measuring refractive index n, attenuation coefficient k, transmission, reflection, and color ■ Compact and lightweight with easy measurement using the included software ■ Automatic XY stage: 2D and 3D plotting (optional) *For more details, please download the PDF or feel free to contact us.

  • Coating thickness gauge

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"Custom specifications available" Non-contact film thickness measurement system 'FF8'

"Custom specifications available" Non-contact film thickness measurement system 'FF8'

The measurement data can be saved to a file, and re-analysis is possible later with a non-contact film thickness measurement system!

The "FF8" is a non-contact film thickness measurement system that measures the reflectance of samples (interference waveforms) and analyzes film thickness values using FFT (Fast Fourier Transform) and other methods. In addition to film thickness measurement, it can also measure the thickness and refractive index of films and glass. With optional features, it is capable of multi-layer film analysis, curve fitting, microscopy, mapping measurements, color measurement, and component concentration analysis. It is also possible to manufacture continuous measurement functions, traverse mechanisms, and data communication functions, allowing it to be used for inline film thickness measurement. 【Features】 ■ Measures the reflectance of samples and analyzes film thickness values using FFT and other methods ■ Can measure the thickness and refractive index of films and glass in addition to film thickness ■ Measurement data can be saved as files, allowing for re-analysis later ■ Can be used for inline film thickness measurement ■ Custom specifications can also be accommodated *For more details, please refer to the PDF document or feel free to contact us.

  • Optical Measuring Instruments

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"Custom specifications available" Non-contact film thickness gauge 'FF8'

"Custom specifications available" Non-contact film thickness gauge 'FF8'

The measurement data can be saved to a file, and re-analysis is possible later with a non-contact film thickness measurement system!

The "FF8" is a non-contact film thickness measurement system that measures the reflectance of samples (interference waveform) and analyzes film thickness values using FFT (Fast Fourier Transform) and other methods. In addition to film thickness measurement, it can also measure the thickness and refractive index of films and glass. With optional features, it is capable of multilayer film analysis, curve fitting methods, microscopy, mapping measurements, color measurement, and component concentration analysis. It is also possible to create continuous measurement functions, traverse mechanisms, and data communication functions, allowing it to be used for inline film thickness measurement. 【Features】 ■ Measures the reflectance of samples and analyzes film thickness values using FFT and other methods ■ Can measure the thickness and refractive index of films and glass in addition to film thickness ■ Measurement data can be saved as files, allowing for re-analysis later ■ Can be used for inline film thickness measurement ■ Custom specifications can also be accommodated *For more details, please refer to the PDF document or feel free to contact us.

  • Optical Measuring Instruments

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